From Microscopy to Spectroscopy: A Comprehensive Approach, Electron Microscopy, Thermal analysis, X-ray Diffraction
This course provides an in-depth exploration of cutting-edge techniques used to characterize materials at the micro and nanoscale. Designed for graduate students and professionals in materials science, engineering, and related fields, the course will cover a range of advanced characterization methods, including:
What you’ll learn
- Students will learn the fundamental principles of various advanced materials characterization techniques and describe their applications in Materials analysis.
- students will learn analyzing data from advanced techniques, demonstrating the ability to interpret results and correlate them with material properties.
- Students will be able to critically assess and select appropriate characterization techniques for different types of materials based on strengths and limitatons.
- Students will apply advanced characterization techniques to solve real-world materials challenges, demonstrating critical thinking and problem-solving skills.
Course Content
- Introduction –> 1 lecture • 5min.
- Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) –> 6 lectures • 1hr 4min.
- Atomic Force Microscopy (AFM) –> 5 lectures • 40min.
- X-ray photoelectron spectroscoy (XPS) and Auger Electron Spectroscopy (AES) –> 7 lectures • 1hr 17min.
- Raman Spectroscopy –> 3 lectures • 42min.
- Electron Energy Loss Spectroscopy –> 4 lectures • 48min.
- Energy Dispersive X-Ray Spectroscopy (EDS or EDX) –> 3 lectures • 41min.
- X-ray Diffraction Analysis (XRD) –> 4 lectures • 44min.
- Thermogravimetric Analysis (TGA) –> 4 lectures • 44min.
- Differential Thermal Analysis –> 2 lectures • 25min.
- Differential Scanning Calorimetry –> 3 lectures • 35min.
Requirements
This course provides an in-depth exploration of cutting-edge techniques used to characterize materials at the micro and nanoscale. Designed for graduate students and professionals in materials science, engineering, and related fields, the course will cover a range of advanced characterization methods, including:
- Electron Microscopy: Techniques such as Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM), Auger Electron Microscopy for high-resolution imaging and analysis.
- X-ray Diffraction (XRD): Understanding crystal structures and phase identification in materials.
- Spectroscopic Methods: in depth understanding of spectroscopic techniques like Raman Spectroscopy, energy dispersive x-ray spectroscopy, and x-ray photoelectron spectroscopy.
- Thermal Analysis: Exploring Differential Scanning Calorimetry (DSC), differential thermal analysis (DTA) and Thermogravimetric Analysis (TGA) to study thermal properties.
- Atomic Force Microscopy: Microscopy at the level will be studied through Atomic force microscopy commonly known as AFM.
Through a series of lectures, and case studies, students will gain practical experience in selecting and applying the appropriate characterization techniques for various materials. The course will also emphasize the importance of data interpretation and the role of advanced characterization in materials development and innovation.
By the end of the course, participants will be equipped with the skills and knowledge necessary to conduct comprehensive materials characterization, enabling them to contribute to advancements in material design and application across multiple industries.